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Focused ion beam (FIB) direct milling of InGaN/GaN MQWs samples are performed with a beam-shape tuning process deliberately, and site-controlled high-aspect-ratio nano-pillars were anomalously produced, without any lithographies. The swelling of p-GaN tip induced by the ion beam live-irradiation served as low-milling-rate sites - the sites on which the resultant nanopillars form. The bump (or blister)...
Surface germanium oxide is often ignored in the ex situ characterization of Ge coherent islands grown on Si substrates. Therefore, the effects of the native oxide have to be justified. We thus intentionally oxidize the Ge coherent islands in air and ozone, strip the oxide layer by water, and assess the effects of native GeO x oxide layer on ex situ shape and strain measurements. We estimate...
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