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Low-resolution high-angle annular dark-field (HAADF) imaging is applied to the study of coherent Ge islands on a Si(001) substrate. Experimental HAADF images reveal a complicated pattern for a coherent Ge island under (001) zone axis conditions due to strain-induced interband scattering between different Bloch-wave branches. This complicated pattern varies with objective aperture size and defocus...
We report on a transmission electron microscopy (TEM) technique that can be used to measure strain due to individual nanometer-scale coherent heterostructures such as quantum dots or inclusions. The measurement relies on two-beam imaging and on an approximation that employs a universal model for lattice plane bending. We demonstrate that analysis is simple and accurate. Using this method, we measured...
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