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Contact resistance between a carbon nanotube and a metal is governed by the structure of the contact. In order to investigate an effect of the contact structure between a multi-walled carbon nanotube (MWNT) and the metal on electric properties, we studied the structural change of the contact region during the passage of a current by in-situ transmission electron microscopy with the simultaneous current...
Front side etching in combination with sample tilting – instead of wafer through etching – allows for transmission electron microscopy (TEM) investigations on nanostructures integrated in microelectromechanical systems (MEMS). We present electron diffraction (ED) of an individual single-walled carbon nanotube (SWNT) suspended between sharp polysilicon tips on the bulk of a MEMS chip. This novel approach...
In this work, aluminum (Al) was deposited on MWNT field emitters and its effects on FE properties were studied by FEM. A considerable improvement of emission stability was obtained by Al-deposition, and an atomically-resolved image of an Al cluster with face-centered structure was observed by FEM.
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