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Scanning electron microscopy (SEM) is shown to be capable of imaging a monolayer of graphene, and is employed to observe in situ the graphene growth process by segregation of bulk-dissolved carbon on a polycrystalline nickel surface. Because of a wide field of view, SEM could easily track the rapid graphene growth induced by carbon segregation. Monolayer graphene extended on (111)- and (011)-oriented...
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