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Severe degradation of Ni‐YSZ (yttria stabilized zirconia) electrodes of solid oxide cells (SOCs) due to Ni migration is well known, but the literature contains apparent contradictions. The mechanisms are still under debate. Fine structured Ni‐YSZ composite electrodes often degrade at operation temperature (700–950°C), because Ni particles lose electrical contact with each other as larger Ni‐particles...
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