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Increased variability in semiconductor process technology and devices requires added margins in the design to guarantee the desired yield. Variability is characterized with respect to the distribution of its components, its spatial and temporal characteristics and its impact on specific circuit topologies. Approaches to variability characterization and modeling for digital logic and SRAM are reviewed...
Fixed- and variable-length ring oscillators (RO's) are designed for characterization of circuit-topology induced variations and spatial correlations. A 930 mum times 775 mum test array is implemented in a low-power 45 nm CMOS process. Measurements from the fixed-length RO's quantify an increase in variability with transistor stack height in logic gates and added variability associated to the top transistor...
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