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Bi1.5Zn1.0Nb1.5O7 (BZN) thin films with good surface morphology were prepared on fused quartz substrates by pulsed laser deposition (PLD). The X‐ray diffraction (XRD) analysis and atomic force microscope (AFM) surface morphology measurements were performed on the samples. The XRD pattern demonstrated that the films are cubic pyrochlore structure and well crystallized. The AFM analysis indicated that...
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