Wyniki wyszukiwania dla: Yu Peng
Microelectronics Reliability > 2017 > 75 > C > 253-263
IEEE Transactions on Systems, Man, and Cybernetics: Systems > 2015 > 45 > 6 > 915 - 928
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 3 > 660 - 670
IEEE Transactions on Reliability > 2010 > 59 > 1 > 30 - 37
IEEE Transactions on Reliability > 2009 > 58 > 3 > 444 - 455