Search results for: Cheng Lin
Electronics Letters > 2016 > 52 > 3 > 232 - 234
IEEE Electron Device Letters > 2015 > 36 > 12 > 1261 - 1263
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 1 > 109 - 114
Microwave and Optical Technology Letters > 57 > 4 > 817 - 820