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The development of a direct non‐destructive synchrotron‐radiation‐based total reflection X‐ray fluorescence (TXRF) analytical methodology for elemental determinations in zirconium alloy samples is reported for the first time. Discs, of diameter 30 mm and about 1.6 mm thickness, of the zirconium alloys Zr‐2.5%Nb and Zircalloy‐4 were cut from plates of these alloys and mirror polished. These specimens...
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