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ISO Technical Report 23173 describes methods by which electron spectroscopies, including X‐ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and synchrotron techniques, can be employed to calculate the coating thicknesses and compositions of nanoparticles. The document has been developed to review and outline the current state‐of‐the‐art for such measurements. Such analyses of...