The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Designers using one-dimension measurements in nanometer designs can't readily identify features prone to excessive variation during processing. Process simulation provides high resolution checking, but requires significant computing resources. Equation-based design rule checking (eqDRC) offers the DRC performance with capture of complex process issues using multi-dimensional equations. One challenge...
Yield enhancements in the manufacturing process today require an expensive, long and tedious physical failure analysis process to identify the root cause. In this paper we present Axiom, a new technique geared towards efficiently identifying a single dominant defect mechanism (for example in an excursion wafer) by analyzing fail data collected from the production test environment. Axiom utilizes statistical...
Like design for manufacturing (DFM), design for reliability (DFR) of a chip identifies design features that are potentially vulnerable to various physical effects that can degrade circuit performance. The difference is that DFR attempts to model long-term effects, such as electromigration. Tools extract design information (resistances and current densities) and apply the data to simulation tools to...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.