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In this paper we shall survey measurements of dielectric properties of materials with respect to precision. We shall consider both optimum and extreme conditions, and try to indicate the source and magnitude of errors. To better acquaint conferees (and readers) with the National Bureau of Standards, we shall choose a disproportionate share of the examples from work done or in progress at NBS.
A cell has been designed and built for measurement of the dielectric constant and dissipation factor of thin films. The principle employed is the two-fluid, three-terminal scheme, 1,2, 3 adapted to thin film measurements. Measurements of dielectric constant, dissipation factor and thickness can be obtained on films ranging from about 250 μm (10 mil) down to 1 μm (0. 04 mil). Agreement is in general...
Recently developed transformer bridges have made it possible to easily make measurements of capacitance to a few ppm (parts per million), particularly at audio frequencies. The question naturally arises: can dielectric constant and phase angle measurements be made with comparable accuracy?
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