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WLCSP has been widely adopted for package solution of the portable and wearable electronics products by its advantages of very low package cost and good electrical performance. Knowing WLCSP provide almost no protection to silicon IC chip, its quality and reliability performance becomes critical for successful product application. A 28nm TV with extreme Low-k inter-metal-dielectic material (ELK IMD)...
This paper reports on trap-related shifts of the transfer curve and threshold voltage of power AlGaN/GaN HEMTs under switched bias operating life and reverse and forward DC bias stress. Opposite polarity threshold voltage shifts at room temperature under operating life and reverse bias stress conditions can be explained by means of drain current transient measurements under reverse bias stress conditions...
Reliability issues of Pb-free solder joints used in microelectronic interconnects, such as BGA, flip-chip, or even 3D-IC, are becoming more critical recently when high performance electronic systems demand more rigorous reliability requirements. The selection of new solder materials has been an important topic in order to enhance the reliability of Pb-free solder joints. In the past few years, numerous...
Different from the MTTF/MTBF widely used to describe the reliability of electronic products, lifetime is used for the LED lamp. The lifetime is defined as a time when 50% of lamp's lumen output is less than 70% of initial value, either by lumen decay of LED light source or catastrophic failure of electronic component. In other words, the reliability of LED lamp consists of not only the MTTF/MTBF of...
This paper discusses an optimal maintenance policy for a parallel system with periodic inspection. The system is composed of several units which have an independent and identical distribution. When the number of failed unit exceeds a threshold level, the system incurs a loss cost per unit of time from a failure to the next inspection. When the next inspection finds the failure, the system is overhauled,...
Surveillance test schedule has been studied to increase standby system availability and keep plant safety. Optimal testing schedules have been studied and developed for simple systems, such as series and parallel systems. For more complex systems, a testing policy was usually chosen among the pre-specified testing strategies based on the performance calculated by computer codes. However, it was not...
Different type of maintenance problems have been investigated during the past decades. With the growth in complexity of modern systems, the cost of purchasing new systems becomes higher ever than before. Surprisingly, very little attention in the literature has been paid to the failure replacement in these preventive maintenance models. However, in practice most systems incur increasingly expensive...
This work reports the results of the first three temperature accelerated RF life test on millimeter-wave GaN heterostructure field effect transistors (HFETs) at 10 GHz. 2times100 mum transistors were stressed at 2 dB compression with a pre RF bias condition of Ids = 100 mA/mm and Vds = 25 V. The three channel temperatures used in study were 285 degC, 315 degC and 345 degC. An activation energy of...
In this paper, a sequential color light emitting diode (LED) backlight driving system for liquid crystal display (LCD) panels is proposed. Due to improvement on luminous efficacy, long life and wide color gamut, LED has gradually substituted for cold cathode fluorescent lamp as backlight The proposed driving system adopts sequential color scanning scheme to improve light utilization efficiency by...
In this paper, a sequential color light emitting diode (LED) backlight driving system for liquid crystal display (LCD) panels is proposed. Due to improvement on luminous efficacy, long life and wide color gamut, LED has gradually substituted for cold cathode fluorescent lamp as backlight The proposed driving system adopts sequential color scanning scheme to improve light utilization efficiency by...
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