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Conventionally, path delay tests are derived in a delay-independent manner, which causes most faults to be robustly untestable. Many non-robust tests are invalidated by hazards caused primarily due to non-zero delays of off-path circuit elements. Thus, non-robust tests are of limited value when process variations change gate delays. The authors propose a bounded gate delay model for test quality evaluation...
A new algorithm for identifying stuck faults in combinational circuits that cannot be detected by a given input sequence is presented. Other than pre and post-processing steps, certain signal conditions are monitored during logic simulation. These signal conditions are specified by an analysis of dominators and signal reconvergences in the circuit graph. After simulation, a post-processing step identifies...
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