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The effects of multiple scattering (MS) on X-ray photoelectron diffraction (XPD) from Si(111)√3 × √3-Ag and -Sb (referred to as √3-Ag and -Sb) surfaces have been studied using a MS concentric-shell algorithm for sufficiently large clusters. Significant MS effects that cannot be reconciled by a kinematical treatment have been seen for the √3-Ag surface, but not for the √3-Sb surface. This indicates...
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