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In this manuscript, we introduced a novel far-field nondestructive testing (NDT) for defects within composite insulators based on the terahertz time-domain spectroscopy (THz-TDS) technology. Impulse waves ranging from 0.02-2 THz were used to test onsite overheated 500 kV composite insulators and samples with artificial void defects. By analyzing the amplitude of time-domain waveform, as well as delay...
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