Search results for: P. Ma
Microelectronic Engineering > 2013 > 106 > Complete > 214-218
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 463 - 479
Microelectronic Engineering > 2012 > 92 > Complete > 79-82
IEEE Electron Device Letters > 2011 > 32 > 4 > 560 - 562