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We have investigated the influence of thermal cycling on two-level fluctuations observed in NbN/MgO/NbN tunnel junctions epitaxially grown on single crystal MgO substrates. The measured voltage noise power spectral density S V (f) had a Lorentzian frequency dependence as expected from the Machlup formula. The bias-voltage dependence of the Lorentzian corner frequency was well explained with...
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