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Early electromigration failure has been recognized as a generic phenomenon in W-plug via structures. Previous studies have attributed early failure to the properties of the Al layers in contact with the plug, via delamination or to current density distributions in the structure. In this paper, we investigate early failure phenomena in W-plug vias and report a novel early via failure induced by the...
Early electromigration failure has been recognized as a generic phenomenon in W-plug via structures. Previous studies have attributed early failure to the properties of the Al layers in contact with the plug, via delamination or to current density distributions in the structure. In this paper, we investigate early failure phenomena in W-plug vias and report a novel early via failure induced by the...
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