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Modern state-of-the-art nanodevices exhibit remarkable electronic properties, but the current assembly techniques yield very high defect and fault rates. Static errors can be addressed at fabrication time by testing and reconfiguration, but soft errors are problematic since their arrival rates are expected to vary over the lifetime of a part. Usual designs consider error correcting codes that tolerate...
The DOslash experiment was upgraded in spring 2006 to harvest the full physics potential of the Tevatron accelerator at Fermi National Accelerator Laboratory, Batavia, Illinois, USA. It is expected that the peak luminosity delivered by the accelerator will increase to over 300 times 1030 cm-2s-1. One of the upgraded systems is the central track trigger (CTT). The CTT uses the central fiber tracker...
A class E amplifier with inductive clamp circuit topology is improved to have stability for all load conditions at any DC supply voltage, Vdc. Based on the new improved topology, the RF Amplifier is designed, simulated and built to be used as a driver for any class of RF amplifier operating within five percent of frequency bandwidth. It is shown that class E amplifiers with inductive clamp circuits...
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