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We measure the nonlinear response of CMOS-compatible SiGe waveguides in the mid-infrared. Comparing with numerical calculations, we extract the multi-photon absorption coefficients and the induced free-carrier absorptions for wavelengths between 3µm and 5µm.
We report an on-chip all-optical CMOS-compatible radio frequency spectrum analyzer with a bandwidth exceeding 2.5 THz, and use it to measure the intensity power spectra of mode-locked lasers with repetition rates up to 400 GHz.
We demonstrate a silicon chip based all-optical device capable of providing single shot time-domain measurements of picosecond pulses near λ=1550nm. The 96µm long device relies on optical third harmonic generation between two pulses in a slow light photonic crystal waveguide.
We demonstrate temporal measurements of sub-picosecond optical pulses via time-to-frequency conversion in a 45-cm-long CMOS compatible high-index glass spiral waveguide. The measurements are based on efficient four-wave mixing in the C-band, using around 1 W of peak pump power. We achieve a resolution of 400 fs over a time window of 100 ps, representing a time-bandwidth product > 250.
We demonstrate a silicon chip-based all-optical device providing single shot time-domain measurements of picosecond pulses near X=1550nm. The auto-correlation visible signal arises from third-harmonic generation in a 96 μm long slow light photonic crystal waveguide.
We present a device for full waveform characterization, exploiting FWM in a CMOS compatible photonic chip, working with pulse energies as low as 10pJ and with sub-picosecond (<;700fs) accuracy over a 100ps temporal window duration.
We demonstrate temporal imaging of optical signals with sub-picosecond time features based on four wave mixing temporal-to-frequency domain conversion in a CMOS compatible, high index glass waveguide.
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