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Testing current high density memory chips using older algorithms is highly time consuming. March test of O(n) is the most widely used approach for its high fault coverage and systematic way of extending the test sequences. Size of the March test is guided by the number of fault models. Most of the March test generation algorithms reported so far, takes long time especially in case of number of operations...
Compared to exhaustive testing, pseudo exhaustive testing requires a smaller test size and lesser test time. Dynamic power dissipation accounts for the major share of power dissipation in CMOS circuits. The amount of heat dissipated limits the density of a chip. The test mode power has been proved to be more than the functional power dissipation. In this work, we propose a method to identify the seed...
This paper addresses the issue of blocking pattern selection to reduce both leakage and dynamic power consumption during circuit testing using scan-based approach. The blocking pattern is used to prevent the scan-chain transitions to reach circuit inputs. This, though reduce dynamic power significantly; can result in quite an increase in the leakage power. We have presented a novel approach to select...
This paper addresses the issue of blocking pattern selection to reduce both leakage and peak power consumption during circuit testing using scan-based approach. The blocking pattern is used to prevent the scan-chain transitions to circuit inputs. This though reduces dynamic power significantly, can result in quite an increase in the leakage power and peak power. We have presented a novel approach...
State encoding is an essential step for sequential circuit synthesis, especially when area, delay and/or power consumption are the main emphasis. Sequential circuits consume a considerable amount of power, as these are used to implement control circuitry, which remains always active even when some of the data-paths are shutdown. With the rapid advancement in VLSI technology and device miniaturization...
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