The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
IDDQ is an effective test method to screen out process related defects during chip probe (CP) test. Through failure analysis it was determined that some production wafers suffering minor yield loss in wafer edge for IDDQ failure was the result from inter layer dielectric cracks. Monitor wafers were processed and utilized for root cause finding using layer-by-layer inline KLA scan review, where the...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.