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We performed a degradation study of high-brightness Nichia single-quantum well AlGaN-InGaN-GaN green light-emitting diodes (LEDs). The devices were subjected to high current electrical stress with current pulse amplitudes between 1 A and 7 A and voltages between 10 V and 70 V with a pulse length of 100 ns and a 1 kHz repetition rate. The study showed that when the current amplitude was increased above...
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