Search results for: J. Lee
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 4 > 803 - 808
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 4 > 797 - 802
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 4 > 803 - 808
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 4 > 797 - 802