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Depression is a common but ominous psychological disorder that threatens one's quality of life. The screening and grading of depression is still a manual process and grades are often determined in ranges, e.g., "mild to moderate' and "moderate to severe' instead of making them more specific as "mild', "moderate', and "severe'. Such grading is confusing and affects the management...
Testing current high density memory chips using older algorithms is highly time consuming. March test of O(n) is the most widely used approach for its high fault coverage and systematic way of extending the test sequences. Size of the March test is guided by the number of fault models. Most of the March test generation algorithms reported so far, takes long time especially in case of number of operations...
Compared to exhaustive testing, pseudo exhaustive testing requires a smaller test size and lesser test time. Dynamic power dissipation accounts for the major share of power dissipation in CMOS circuits. The amount of heat dissipated limits the density of a chip. The test mode power has been proved to be more than the functional power dissipation. In this work, we propose a method to identify the seed...
Test mode power dissipation has been found to be much more than the functional power dissipation. Since dynamic power dissipation had a major contribution to the heat generated, most of the studies focused on reducing the transitions during testing. But at submicron technology, leakage current becomes significantly high. This demands a control on the leakage current as well. In this work, we propose...
Power consumption during test mode is much higher than in normal mode of operation. This paper addresses issue of assigning suitable values to the unspecified bits (don't care) in the test patterns so that both static and dynamic power consumption during testing is reduced. We have used a genetic algorithm based heuristic to fill the don't cares. Our approach produces an average percentage improvement...
In recent years, power dissipation has emerged as the key issue not only for portable computers and mobile communication devices, but also for high-end systems. Reducing power dissipation is of primary importance in achieving longer battery life in portable devices. On the other hand, for high-end systems the cooling and packaging requirements are pushing the chip designers for low power alternatives...
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