Search results for: P. Liu
2013 IEEE International Reliability Physics Symposium (IRPS) > 4C.2.1 - 4C.2.10
IEEE Electron Device Letters > 2013 > 34 > 1 > 3 - 5
Thin Solid Films > 2003 > 424 > 1 > 9-14
2013 IEEE International Reliability Physics Symposium (IRPS) > 4C.2.1 - 4C.2.10
IEEE Electron Device Letters > 2013 > 34 > 1 > 3 - 5
Thin Solid Films > 2003 > 424 > 1 > 9-14