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We examined the ability to detect deep-lying defects in multilayer stacks of aluminum plates using an eddy-current testing technique with HTS planar-type SQUID gradiometers. In addition to a previous gradiometer with a baseline of 1 mm, a new gradiometer with a baseline of 8.5 mm and a larger effective area fabricated by HTS multilayer and ramp-edge junction technologies was used. The frequency and...
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