Search results for: Ting-Chang Chang
Thin Solid Films > 2017 > 644 > C > 45-51
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 799 - 801
SID Symposium Digest of Technical Papers > 48 > 1 > 1311 - 1314
IEEE Electron Device Letters > 2016 > 37 > 2 > 228 - 230