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We conducted accelerated reliability tests of electron-only devices (EODs) and organic light-emitting diodes (OLEDs) differing only in their electron-transport material (ETM). High current stressing of EODs at 50mA/cm2 showed that Bphen~Alq3>TPBi>TAZ in terms of intrinsic material stability. In addition, the lowest unoccupied molecular orbital (LUMO) level and electron mobility have been identified...
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