The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
A novel approach for estimating variation in the TDDB failure time is reported. The results for structures with Dual Damascene copper-based metallization and a low-k dielectric material demonstrate that variation in the initial current at stress reasonably predicts variation in the TDDB failure time. Moreover, the method does not cause failure in the structures and is more efficient compared to other...
Qualification testing of photovoltaic modules is a set of well-defined accelerated stress tests with strict pass/fail criteria based on functionality / performance, safety / insulation and visual requirements. This paper, third in series from the Photovoltaic Testing Laboratory of ASU / TUV Rheinland PTL, compares the overall failure rates obtained in three consecutive periods: 1997-2005, 2005-2007...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.