Search results for: L. Lee
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-3-1 - 4B-3-5
IEEE Electron Device Letters > 2016 > 37 > 4 > 512 - 515
IEEE Electron Device Letters > 2011 > 32 > 4 > 536 - 538
IEEE Photonics Technology Letters > 2011 > 23 > 14 > 968 - 970
IEEE Electron Device Letters > 2011 > 32 > 10 > 1400 - 1402
IEEE Transactions on Plasma Science > 2010 > 38 > 11-1 > 3071 - 3078