Search results for: P. Chang
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 76 - 80
Journal of Lightwave Technology > 2008 > 26 > 11 > 1455 - 1463
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 76 - 80
Journal of Lightwave Technology > 2008 > 26 > 11 > 1455 - 1463