Search results for: H. Lee
2016 IEEE International Electron Devices Meeting (IEDM) > 27.2.1 - 27.2.4
2015 IEEE International Reliability Physics Symposium > 4A.2.1 - 4A.2.5
Proceedings of the 33rd Chinese Control Conference > 1013 - 1020
IEEE ICCA 2010 > 285 - 290