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Smart materials actuated devices have been attracting tremendous attentions for decades, especially nowadays. Smart material actuators have been prevalently utilized in the fields such as soft robots and nano-engineering for their outstanding merits such as flexibility and ultrahigh spatial resolution. Although, usage of these smart material actuators can facilitate transmission systems design, problems...
Atomic Force microscopy (AFM) is a powerful technology for observing and developing the micro/nano world, which has been bringing tremendous revolution opportunities to various fields. An AFM's maneuverability can be enhanced via modification into a nanorobotic system with its scanning probe working as the end-effector. The probe's spatial precision can easily reach to nanometer level, which is commonly...
Micro/nano-manipulation systems have been developed and utilized for decades due to their irreplaceable roles in fields such as MEMS/NEMS fabrication and biological studies. Generally, the motion precision of a micro/nano-manipulator highly depends on its actuator, whose performance can be enhanced by proper control strategies. To design satisfactory controllers, an accurate plant model is ideal....
Atomic force microscope (AFM) has been defined as the one of the most powerful instruments to explore micro/nanoworld in various fields. To lower imaging noise, AFMs are commonly equipped with open-loop nanopositioners (scanners). However, the hysteretic effect of the AFM positioners is a dominate factor that increases the position error during AFM-based manipulations. To reduce hysteresis, inverse...
Nanorobotics have been successfully applied to investigate the physical and biomedical properties in the nano scale. As the center piece of nanorobotcis Scanning probe microscope (SPM) has been widely used to measure the topography information of sample surface as well as serving as a manipulation and sensing tool to modify and measure the mechanical and physical properties of sample. However, the...
Atomic force microscopy (AFM) is a powerful measurement instrument, which has been widely implemented in various fields. To enhance the maneuverability, an AFM can be modified and its cantilever can be controlled as a robotic end-effector. To precisely control the nanorobots, their scanners inherent hysteresis, which is the main disadvantage, should be compensated sufficiently. Mostly, hysteresis...
Atomic force microscopy (AFM) based nanomanipulations have been successfully applied to various fields such as physics, material science and biomedical studies. In general, the precision of AFM based nanomanipulation has been compromised mainly by hysteresis and creep of the piezo actuator. In this paper, a new approach, named scan range adaptive hysteresis/creep hybrid (SAH) compensator, is proposed...
The atomic force microscope (AFM) has become a standard technique to measure the topography properties of sample surfaces with nanometer resolution. And the AFM tip based Nano manipulation system plays an important role in the field of Nano research. However, nearly all the systems are designed in the commercial AFM machine, in which the software and hardware is not open to perform the Nano manipulation...
For AFM based robotic nanomanipulation system without displacement sensor, one of the key technical problems is to realize high accurate positioning of the AFM probe. To solve the problem, based on the hysteresis and nonlinear characteristics analysis of AFM PZT actuator, a new actuating method called "actuating method based on reappearing the scanning trajectory" is presented to actuate...
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