Search results for: S. H. Kim
IEEE Electron Device Letters > 2017 > 38 > 3 > 314 - 317
2016 IEEE International Electron Devices Meeting (IEDM) > 15.7.1 - 15.7.4
2012 International Electron Devices Meeting > 23.1.1 - 23.1.4
2010 International Electron Devices Meeting > 3.1.1 - 3.1.4