Search results for: D. Tikhonov
The European Physical Journal Special Topics > 2019 > 228 > 5 > 1109-1382
The European Physical Journal Special Topics > 2019 > 228 > 4 > 755-1107
The European Physical Journal C > 2019 > 79 > 6 > 1-161
The European Physical Journal Special Topics > 2019 > 228 > 2 > 261-623
Semiconductors > 2017 > 51 > 13 > 1707-1708
Measurement Techniques > 2017 > 60 > 8 > 831-838
European Psychiatry > 2017 > 41 > S > S278
Russian Microelectronics > 2017 > 46 > 2 > 95-104
Russian Microelectronics > 2015 > 44 > 2 > 101-113
Russian Microelectronics > 2015 > 44 > 7 > 487-491
Measurement Techniques > 2013 > 56 > 3 > 309-313
Russian Microelectronics > 2013 > 42 > 7 > 378-383
Russian Microelectronics > 2013 > 42 > 4 > 220-229
Measurement Techniques > 2009 > 52 > 12 > 1344-1350
Measurement Techniques > 2009 > 52 > 4 > 410-415
Measurement Techniques > 2008 > 51 > 8 > 896-902