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We present novel and efficient methods for built-in self-test (BIST) of field-programmable gate arrays (FPGAs) for detection and diagnosis of permanent faults in current, as well as emerging, technologies that are expected to have high fault densities. Our basic BIST methods can be used in both online and offline testing scenarios, although we focus on the former in this paper. We present 1- and 2-diagnosable...
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