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In this work a de-embedding technique oriented to the determination of FET I-V dynamic characteristics is reported. It exploits high-frequency large-signal measurements and a model based description of the reactive nonlinearities. The proposed technique allows one to gather information about the intrinsic I-V dynamics, including traps related dispersion and thermal phenomena, directly from high-frequency...
An experimental investigation of the low-frequency dispersion affecting the behaviour of microwave devices is reported in this work. The study has been carried out by exploiting two different measurement techniques and experiments have been performed on a GaN based HEMT. In particular, bias and frequency dependence of dynamic characteristics has been clearly observed. Moreover, asymmetric behaviour...
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