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Subtle defects such as low resistive vias and high resistive shorts cause Small-Delay Defects that are hard to detect even by advanced test methodologies. Detection of these defects aggravates with process variations becoming an important source of test escapes. Furthermore, these defects may degrade with time posing a reliability risk. In this paper, a novel methodology to detect SDDs in the presence...
Detection of Small Delay Defects (SDDs) is a major concern in modern circuits using nanometer technologies. They are difficult to test and an important source of test escapes, and even when SDDs do not produce functional failures, they represent a reliability risk. The detection of these defects aggravates in the presence of process variations. In this paper, a methodology to detect SDDs in the presence...
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