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The unwanted photoacoustic pressure force in photoexpansion spectroscopy, which comes from light absorption of the sample not below the AFM tip, was suppressed at the heterodyne frequency of laser pulses and piezo-driven cantilever oscillation.
The ultimate sensitivity of mid-infrared photoexpansion nanospectroscopy is limited by the background signal from photoexpansion of the sample substrate and the probe tip. Here we demonstrate suppression of this signal using a second mid-infrared laser.
We report a highly-sensitive technique to obtain mid-infrared spectra with nanoscale spatial resolution via detecting a mechanical force exerted by vibrating molecules on an atomic force microscope tip. Sub-monolayer sensitivity is demonstrated.
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