The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Due to the fact that software systems cannot be tested exhaustively, software systems must cope with residual defects at run-time. Local recovery is an approach for recovering from errors, in which only the defective parts of the system are recovered while the other parts are kept operational. To be efficient, local recovery must be aware of which component is at fault. In this paper, we combine a...
Locating software components which are responsible for observed failures is the most expensive, error-prone phase in the software development life cycle. Automated diagnosis of software faults can improve the efficiency of the debugging process, and is therefore an important process for the development of dependable software. In this paper we present a toolset for automatic fault localization, dubbed...
Fault diagnosis approaches can generally be categorized into spectrum-based fault localization (SFL, correlating failures with abstractions of program traces), and model-based diagnosis (MBD, logic reasoning over a behavioral model). Although MBD approaches are inherently more accurate than SFL, their high computational complexity prohibits application to large programs. We present a framework to...
Current automatic diagnosis techniques are predominantly of a statistical nature and, despite typical defect densities, do not explicitly consider multiple faults, as also demonstrated by the popularity of the single-fault Siemens set. We present a logic reasoning approach, called Zoltar-M(ultiple fault), that yields multiple-fault diagnoses, ranked in order of their probability. Although application...
Automated fault diagnosis is emerging as an important factor in achieving an acceptable and competitive cost/dependability ratio for embedded systems. In this paper, we survey model-based diagnosis and spectrum-based fault localization, two state-of-the-art approaches to fault diagnosis that jointly cover the combination of hardware and control software typically found in embedded systems. We present...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.