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High-precision electrical resistance measurements were performed on holmium and thulium bulk and thin-film samples in the temperature range from 4.2 K up to room temperature. A “knee-like” resistance anomaly near the Néel temperature was observed in Ho bulk and thin-film samples. The X-ray diffraction of Ho films revealed diffraction peaks coming from the h.c.p. structure of Ho and those from holmium...
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