Search results for: C. Hsu
IEEE Transactions on Instrumentation and Measurement > 2014 > 63 > 9 > 2271 - 2278
IEEE Electron Device Letters > 2010 > 31 > 7 > 749 - 751
IEEE Transactions on Instrumentation and Measurement > 2014 > 63 > 9 > 2271 - 2278
IEEE Electron Device Letters > 2010 > 31 > 7 > 749 - 751