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A telescope for a beam test have been developed. The system is intended to measure the spatial resolution performance of different types of silicon detectors. The telescope has four XY measurement as well as trigger planes (XYT board). It can accommodate up to twelve devices under test (DUT board). The DUT board uses two Beetle ASICs for the readout of chilled DUT, microstrip or pixel silicon detectors...
A readout system for microstrip silicon sensors has been developed. This system is able to measure the collected charge in one or two microstrip silicon sensors by reading out all the channels of the sensor(s), up to 256. The system can operate either with non-irradiated and irradiated sensors as well as with n-type and p-type microstrip silicon sensors. Heavily irradiated sensors will be used at...
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