The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Geometrical dependence of the magnetoresistivity using polycrystalline bismuth microwire array was measured under magnetic fields of 0-2 T at temperatures of 50-300 K, and its diameter of prepared microwire arrays were 10 and 25 mum. Aspect ratio, defined by wire length divided by the diameter, was determined for the wire array since both edges of all wires were attached to Ti thin film layer in order...
Contact resistance at the terminations of bismuth wire array of 25 mum diameter is reduced by ion plating of a titanium interlayer 100 nm upon the wire ends. 1,000 nm-thick copper electrodes are ion plated upon the titanium. Copper probe electrodes are then attached using Pb-Sn solder. The temperature dependence of the Seebeck coefficient and resistance are measured upon heating from 25 K to 300 K...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.