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A technique to rapidly correct for both DAC and gain errors in the multibit first stage of an 11-bit pipelined ADC is presented. Using a dual-ADC based approach the digital background scheme is validated with a proof-of-concept prototype fabricated in a 1.8 V 0.18 CMOS process, where the calibration scheme improves the peak INL of the 45 MS/s ADC from 6.4 LSB to 1.1 LSB after calibration. The SNDR/SFDR...
A technique to rapidly correct for DAC errors in the multi-bit first stage of an 11-bit pipelined ADC is presented. Using a split-ADC approach the digital background scheme is validated with a proof-of-concept prototype fabricated in 1.8 V 0.18 mum CMOS, where the calibration scheme improves the INL of the ADC at fs=45 MS/s, from +6.1/-6.4 LSB to +1.1/-1 LSB after calibration. The SNDR/SFDR is improved...
A split-ADC architecture is used to calibrate both the non-linearity errors introduced by capacitor mismatches in the DAC, and gain errors in the residue amplifier of the first stage in a pipelined ADC. The background scheme only requires 105 clock cycles to perform the calibration to more than 12b accuracy. Simulated in Simulink and Spice, the digital calibration scheme improves the ADC's SNDR/SFDR...
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