Search results for: Sheng Ye
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 11 > 2803 - 2812
IEEE Transactions on Reliability > 2016 > 65 > 4 > 1737 - 1744
IEEE Photonics Technology Letters > 2008 > 20 > 10 > 851 - 853
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 11 > 2803 - 2812
IEEE Transactions on Reliability > 2016 > 65 > 4 > 1737 - 1744
IEEE Photonics Technology Letters > 2008 > 20 > 10 > 851 - 853