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The in-phase bias modulation (IPBM) mode of scanning ion conductance microscopy (SICM), which has advantages of both the dc mode and the traditional ac mode, is immune to low-frequency external electronic interference and potential drift while maintaining a high scanning speed. However, the IPBM mode still suffers from a low-signal-to-noise ratio (SNR). In this paper, we propose a capacitance compensation...
In developing nano-devices and nano-structures, traditional methodologies on MEMS meet the difficulty from the scale restriction. With the strategy of objects assembly, using AFM to handle nano-rods and other nano-objects is considered as an important and high potential technology in constructing nano-structures. However most of AFM only has one tip as the end effector and cannot control both translational...
Nanomanipulation and nanoassembly using atom force microscopy (AFM) is a potential and promising technology for nanomanufacturing. Precise position of the tip of AFM is important to increase the accuracy and efficiency on fabricate complex nanostructures. However at the nano-scale, it is difficult to acquire the tip position expressed by the coordinate in real time due to PZT nonlinearity and thermal...
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